Numerical and Experimental Near Field Distributions in High-Frequency Planar Circuits
نویسندگان
چکیده
A new test system for measuring electric field profile in planar circuits such as microstrip-line has been developed. In order to estimate the measured electric field profile, the 3D full-wave analysis is carried out by using a finite-difference time domain technique for planar printed circuits in high-frequency ranges. A test system proposed in this paper based on a small coaxial probe antenna and is not required complicated measurement system setup. The upper limit of the operating frequency and the spatial resolution for this measurement will be clarified.
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